This product contains full area coverage MoS2 monolayers on SiO2/Si substrates. Sample size measures 1cm in size and the entire sample surface contains monolayer thick MoS2 sheet. Synthesized full area coverage monolayer MoS2 is highly luminescent and Raman spectroscopy studies also confirm the monolayer thickness. In comparison to full area coverage MoS2 on sapphire, full area coverage MoS2 on SiO2/Si display higher PL intensity.
Sample Properties.
Sample size | 1cm x 1cm square shaped |
Substrate type | Thermal oxide (SiO2/Si) substrates |
Coverage | Full Coverage Monolayer |
Electrical properties | 1.85 eV Direct Bandgap Semiconductor |
Crystal structure | Hexagonal Phase |
Unit cell parameters | a = b = 0.313 nm, c = 1.230 nm, α = β = 90°, γ = 120° |
Production method | Atmospheric Pressure Chemical Vapor Deposition (APCVD) |
Characterization methods | Raman, photoluminescence, TEM, EDS |
Specifications
1) Full coverage * monolayer MoS2 uniformly covered across SiO2/Si substrates.
2) . One centimeter in size. Larger sizes up to 2-inch wafer-scale available upon requests.
3) Atomically smooth surface with roughness < 0.2 nm.
4) Highly uniform surface morphology. MoS2 monolayers uniformly cover across the SiO2/Si substrates.
5) 99.9995% purity as determined by nano-SIMS measurements
6) Repeatable Raman and photoluminescence response
7) High crystalline quality, Raman response, and photoluminescence emission comparable to single crystalline monolayer flakes.
8) SiO2/Si substrates. But our research and development team can transfer MoS2 monolayers onto variety of substrates including PET and quartz without significant compromisation of material quality.
9) MoS2 monolayers do not contain intentional dopants or defects. However, our technical staff can produce defected MoS2 using α-bombardment technique.
Supporting datasets [for * Full area coverage on SiO2/Si]
Transmission electron images (TEM) acquired from CVD grown full area coverage MoS2 monolayers on SiO2/Si confirming highly crystalline nature of monolayers
Energy dispersive X-ray spectroscopy (EDX) characterization on CVD grown full area coverage MoS2 on SiO2/Si confirming Mo:S 1:2 ratios
Room temperature photoluminescence spectroscopy (PL) and Raman spectroscopy (Raman) measurements performed on CVD grown full area coverage MoS2 monolayers on SiO2/Si. Raman spectroscopy measurement confirm monolayer nature of the CVD grown samples and PL spectrum display sharp and bright PL peak located at 1.85 eV in agreement with the literature.
